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CEA/DAM electronic component test bed: TEMIC (micro-circuit tests)


The TEMIC system is used for testing electronic components exposed to a stream of particles.




System operations involve three phases:

  • Configuration: describe either the topology of the component to test, and the values and sequences to apply
  • Testing: perform many action cycles (write, exposure to a particular particle stream, read), or one of the three actions
  • Analysis: analyze the test results (formatting, graphical display, processing, and conversion to a spreadsheet format)

The test bed architecture currently includes an industrial PC running Windows XP with a National Instruments data acquisition board.